Upset Manifestations in Embedded Digital Signal Processors due to Single Event Effects

نویسنده

  • Roberto M. Monreal
چکیده

Digital Signal Processors (DSP) embedded in FPGAs are irradiated with heavy ions in order to further understand the impact of particle-induced Single Event Effects (SEE) to their functionality. SEE upset duration and start-time measurements taken of various DSPs simultaneously during irradiation experiments provide a portrait of the various contributing upset mechanism as well as on-orbit rate estimates.

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تاریخ انتشار 2012